|
Reference, Title | Downloads |
Circulation Date |
Closing Date |
CENELEC | Voting / Comment | Of interest to Committees |
|---|---|---|---|---|---|---|
| 47E/836/RQ Result of Questionnaire on 47E/829/Q: Nomination for a Co-convenor of 47E//WG 9: Laser diodes, LEDs, PDs and APDs | 2024-05-31 | N/A | ||||
| 47E/835/FDIS IEC 60747-16-9 ED1: Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters | 2024-05-10 | 2024-06-21 | Y | |||
| 47E/832/FDIS IEC 60747-15 ED3: Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2024-05-03 | 2024-06-14 | Y | |||
| 47E/831/Q Questionnaire on the maintenance work of IEC 60747-14-4:2011 Ed.1.0 | 2024-04-26 | 2024-06-07 | N/A | Report of Comments | ||
| 47E/834/NP PNW 47E-834 ED1: Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes | 2024-04-26 | 2024-07-19 | U | |||
| 47E/830/CD IEC 60747-14-12 ED1: Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors | 2024-04-19 | 2024-07-12 | E | |||
| 47E/829/Q Nomination of a Co-Convenor for SC 47E/WG 9: Laser diodes, LEDs, PDs and APDs | 2024-04-12 | 2024-05-24 | N/A | Report of Comments | ||
| 47E/828/CD IEC 60747-5-18 ED1: Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes | 2024-03-29 | 2024-05-24 | E | Report of Comments | ||
| 47E/817B/RVN Revised Result of Voting on 47E/809/NP - PNW 47E-809 ED1: Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors | 2024-02-02 | E | ||||
| 47E/827A/RVC Revised Result of Voting on 47E/812/CDV - IEC 60747-15 ED3: Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2024-01-19 | Y | ||||
| 47E/817A/RVN Revised Result of Voting on 47E/809/NP - PNW 47E-809 ED1: Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors | 2024-01-12 | E | ||||
| 47E/825/CC Compilation of Comments on 47E/810/CD - IEC 60747-2 ED4: Semiconductor devices - Part 2: Discrete devices - Rectifier diodes | 2024-01-12 | N | ||||
| 47E/826/CC Compilation of Comments on 47E/811/CD - IEC 60747-6 ED4: Semiconductor devices - Part 6: Discrete devices - Thyristors | 2024-01-12 | N | ||||
| 47E/827/RVC Result of Voting on 47E/812/CDV - IEC 60747-15 ED3: Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2024-01-12 | Y | ||||
| 47E/822A/RVC Revised Result of Voting on 47E/803/CDV - IEC 60747-16-9 ED1: Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters | 2023-12-29 | Y | ||||
| 47E/819/CDV IEC 60747-5-4/AMD1 ED2: Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers | 2023-12-22 | 2024-03-15 | N | Voting Result | SC 86C | |
| 47E/823/RM Unconfirmed minutes of the SC 47E plenary meeting on Nov. 16th, 2023 held in Frankfurt, Germany (14:00 ? 16:30) | 2023-12-08 | N/A | ||||
| 47E/824/RVN Result of Voting on 47E/815/NP - PNW 47E-815 ED1: Semiconductor devices ? Part 5-18: Optoelectronic devices ? Light emitting diodes ? Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes | 2023-12-08 | E | ||||
| 47E/822/RVC Result of Voting on 47E/803/CDV - IEC 60747-16-9 ED1: Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters | 2023-12-01 | Y | ||||
| 47E/821/DL List of decisions taken at the meeting of SC 47E, held on 16th November 2023 | 2023-11-24 | N/A | ||||
| 47E/820/CC Result of Voting on 47E/787/NP - PNW 47E-787 ED1: Semiconductor devices ? Part 16-11: Microwave integrated circuits ? Detectors | 2023-11-03 | N | ||||
| 47E/816A/DA Revised draft agenda of the SC 47E plenary meeting to be held in Frankfurt, Germany, on 16th November 2023 (14.00h ? 17.00h) | 2023-10-20 | N/A | ||||
| 47E/818/INF Review of Active Participation of P-members in the Work of SC 47E | 2023-10-20 | N/A | ||||
| 47E/817/RVN Result of Voting on 47E/809/NP - PNW 47E-809 ED1: Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors | 2023-10-13 | E | ||||
| 47E/816/DA Replaced by 47E/816A/DA | 2023-09-01 | N/A | ||||
| 47E/812/CDV IEC 60747-15 ED3: Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2023-08-18 | 2023-11-10 | Y | Voting Result | ||
| 47E/814/RVN Result of Voting on 47E/808/NP - PNW 47E-808 ED1: Semiconductor devices -Part 5-17: Optoelectronic devices - Light emitting diodes - Measuring methods of micro scale light emitting diodes array | 2023-08-11 | U | ||||
| 47E/815/NP PNW 47E-815 ED1: Semiconductor devices ? Part 5-18: Optoelectronic devices ? Light emitting diodes ? Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes | 2023-08-11 | 2023-11-03 | E | Voting Result | ||
| 47E/813/CC Compilation of Comments on 47E/807/CD - IEC 60747-5-4/AMD1 ED2: Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers | 2023-07-14 | N | SC 86C | |||
| 47E/809/NP PNW 47E-809 ED1: Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors | 2023-06-16 | 2023-09-08 | E | Voting Result | ||
| 47E/810/CD IEC 60747-2 ED4: Semiconductor devices - Part 2: Discrete devices - Rectifier diodes | 2023-06-16 | 2023-09-08 | N | Report of Comments | ||
| 47E/811/CD IEC 60747-6 ED4: Semiconductor devices - Part 6: Discrete devices - Thyristors | 2023-06-16 | 2023-09-08 | N | Report of Comments |
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